10 results
Sample Preparation Challenges in Advanced Semiconductor Test Structures
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 684-685
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Focused Ion Beam Techniques for Butterfly Wing Scales Analysis and 3-D Reconstruction
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 983 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0983-LL03-02
- Print publication:
- 2006
-
- Article
- Export citation
Millimeter-scale surface nano-structuring using focused ion beam milling
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 901 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0901-Ra05-16-Rb05-16
- Print publication:
- 2005
-
- Article
- Export citation
Focused ion beam microscope as an analytical tool for nanoscale characterization of gradient-formulated polymeric sensor materials
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 894 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0894-LL07-06
- Print publication:
- 2005
-
- Article
- Export citation
Chemical Vapor Deposition of ZnS:Mn for Thin-Film Electroluminescent Display Applications
-
- Journal:
- Journal of Materials Research / Volume 19 / Issue 3 / March 2004
- Published online by Cambridge University Press:
- 03 March 2011, pp. 697-706
- Print publication:
- March 2004
-
- Article
- Export citation
Oxidation Kinetics and Microstructure of Wet-Oxidized MBE-Grown Short-Period AlGaAs Superlattices
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 692 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, H9.44.1
- Print publication:
- 2001
-
- Article
- Export citation
Physical Properties and Diffusion Characteristics of CVD-Grown TiSiN Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 697 / January 2001
- Published online by Cambridge University Press:
- 17 March 2011, P8.18
- Print publication:
- January 2001
-
- Article
- Export citation
MOCVD ZnS:Mn Films: Crystal Structure and Defect Microstructure as a Function of the Growth Parameters
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 695 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, L2.5.1
- Print publication:
- 2001
-
- Article
- Export citation
MOCVD ZnS:Mn Films: Grain Size Distribution and Crystal Structure as a Function of the Growth Parameters
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 672 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, O3.33
- Print publication:
- 2001
-
- Article
- Export citation
Epitaxial Al and Cu films grown on CaF2/Si(111)
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 648 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, P11.38
- Print publication:
- 2000
-
- Article
- Export citation